Journey to Data Quality

by Lee, Yang W.
5 out of 5 Customer Rating
ISBN: 9780262122870
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$9.99

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Overview

  • Format: Hardcover
  • Author: Lee, Yang W.
  • ISBN: 9780262122870
  • Condition: Used
  • Dimensions: 9.08 x 0.73
  • Number Of Pages: 226
  • Publication Year: 2006

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